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Search for "high-quality-factor resonators" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5
- , providing deeper insight into the tip–surface interaction. We demonstrate the capabilities of ImAFM approach measurements on a polystyrene polymer surface. Keywords: atomic force microscopy; AFM; frequency combs; force spectroscopy; high-quality-factor resonators; intermodulation; multifrequency
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